Camera-based systems are the standard used for laser beam profiles using pulsed light. The cameras used are designed to measure and monitor the beam’s length. The applications of these systems are many and varied. Learn more about the benefits of SWIR camera-based laser systems that use SWIR cameras for beam profiling.
The advantages of silicon-based Optical Systems
Silicon-based charge-coupled devices and silicon-based complementary metal-oxide-semiconductors (e.g. CCDs and CMOS) are commonly used in high-performance imaging applications . They are capable of detecting wavelengths that span from soft x-rays into near-infrared (NIR). In general, the quantum efficiency of CCDs is reduced as the wavelength of detection increases further into the NIR range. When the wavelength is greater than 1100 nm, with conventional CCDs and CMOS system light is not absorbent by a silicon-based crystal since the photons in this kind of light lack enough energy to cause an electron to leap.
The latter type features large-area sensors that have high resolution, which is crucial for precise measurements of both small and massive laser beams. Both types of profilers count the wavelengths that range from UV up to the near infrared (IR).
SWIR Vision Systems has a proprietary camera line for laser beam profiling with an 800 to 1,700 nm sensor band range based upon colloidal quantum dots (CQD) – thin film photodiodes that are made in a single piece made from readout quartz wafers. They have the potential to accomplish the same thing for SWIR imaging the same thing that CMOS image sensors and micro-bolometer arrays have achieved for visible and longwave imaging, respectively. SWIR CQD laser imaging sensors are available in both camera-based and camera-less versions.
Before making a choice on the detector used, one must be aware of every aspect of the application, including how wavelengths respond.
Selecting an optical system to perform measured pulsed laser beams
Regarding the use of the technology, there is no one-size-fits-all profilers available, as different lasers have different wavelengths. In addition, they have different beam sizes and power levels, so need different optics. Optical systems must have wavelength-specific attenuators and antireflective coatings in order to precisely detect the spectrum. These distinctions can lead to errors in measuring processes.
Camera-based laser beam profiling systems are the most popular choice to measure large beams. These systems employ an CMOS-based or photodiode-based sensor to identify the wavelength. In fact, camera-based systems are used in many different ways for industrial settings, research and development, and in military applications.
Camera-based systems for pPulsed laser beam profilers have numerous advantages over devices based on slits. Slit-based systems permit the measurement of extremely small beams directly while camera-based systems analyze both focused and unfocused beams. They are especially beneficial in factory floor applications, where accuracy and repeatability are crucial.
Camera-based systems for pulsed laser beam profilers are incredibly sensitive to artifacts associated with narrow-linewidth laser radiation. The artifacts are removed by careful optical design.
The camera-based system is the ideal choice for a wide range of applications.The cameras used for Pulsed Laser beam Profiling (PLB) are usually C-mount compatible. The camera head itself doesn’t have a faceplate in front of the sensor chip therefore there’s no requirement to buy a separate ND filter (the filters block all light sources from your sensor).
Contrary to traditional laser beam measurements that require an optical lens with a fixed aperture to view a beam, Acuros CDQ Sensors can laser beam profile without cameras. A camera isn’t ideal for applications with large beams, as it cannot reliably take beams with smaller diameters.
Applications
Applications of SWIR Laser Beam Profiling are numerous. These measurements are useful for a wide range of processes that include laser collimation as well as analysis. There are several benefits of making use of the CCD beam profiler including the ability to measure astigmatism and its ability to move around the beam’s path. For example, a CCD beam profiler is able to measure the astigmatism of a laser beam, that is essential for measuring for astigmatism when imaging medically. Moreover the CCD beam profiler can determine astigmatism even without a cover glass. Furthermore, the lack of a cover glass is a key characteristic of CCD beam profiler. Although a CCD camera might not be suitable for all applications however, it is generally preferred to use for SWIR laser beam tracking, depending on the application in hand.
